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在线研讨会――PoP组件的互联耐久性
点击:7929来源: fbe-china.com作者:EM Asia China
时间:2019-11-20 13:32:24

December 7, 2010, 11:00am US EST $300 for non-consortium members. Free for consortium members On December 7, Dr. Michael Osterman will present an intriguing web seminar on Interconnect Durability of Package on Package Assemblies. In this one-hour seminar, Dr. Osterman will discuss Package on Package (PoP) methodologies, an emerging trend in packaging technology, and present an assessment of solder interconnect reliability in pre-stacking or in-line stacking and reflow-produced PoP assemblies. Seminar participants will learn how this developing methodology will be useful in multiple applications, from mobile to industrial and beyond.

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