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第六届锡须国际研讨会召开
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时间:2019-11-20 10:43:23

Organized by

Department of Materials Research at Loughbourugh University

Center for Advanced Life Cycle Engineering ( CALCE )

Contact

Dr. Michael Osterman, CALCE, University of Maryland, osterman@calce.umd.edu

Dr Geoffrey D. Wilcox, Department of Materials Research, G.D.Wilcox@lboro.ac.uk

The Center of Advanced Life Cycle Engineering at the University of Maryland and Department of Materials Research at Loughbourugh University are pleased to announce the Sixth International Symposium on Tin Whiskers. Tin whiskers present a unique challenge to the electronics industry. There have been numbers of electronics failures in the market caused by tin whiskers since 1940s. After 2000, as a result of the global transition to lead-free electronics, the majority of the electronic component manufacturers are now using pure tin or tin-rich alloys for terminal and lead finishes. The increased used of tin based lead-free finishes and materials, focused concern and research on tin whiskers particular for long life and mission critical applications, such as space, aviation, and implantable medical devices.

A tin whisker is a conductive tin crystal, which can spontaneously grow from tin based lead-free finished surfaces even at room temperature, often in a needle-like form. Oxidation in humid atmosphere, corrosion, intermetallic formation, stress under thermal cycling, external pressure in fine pitch connectors and electromigration have been shown to promote whisker formation. However, acceleration models for whisker growth are very limited or not existent.

Listing of proceeding of prior International Symposia on Tin Whiskers can be found at http://www.calce.umd.edu/tin-whiskers/symposia.htm

This symposium presentations can cover case histories, theories of tin whisker growth experiments and results, risk evaluation methods and risk mitigation strategies. Presentations submitted for this years symposium may cover case histories, theories of tin whisker growth, experiments and results, risk evaluation methods and risk mitigation strategies. Free admission will be provided to symposium participants.

Important Dates

Presentation Abstracts due by August 12, 2012

Acceptance by September 7, 2012

Presentations due November 2, 2012

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