当前位置:首页 > 资讯中心
JTAG Technologies将参加IEEE Autotestcon Baltimore
点击:8676来源: fbe-china.com作者:Kenny Fu
时间:2019-11-02 21:18:25

Eindhoven, the Netherlands --- July 12th - IEEE AUTOTESTCON is the United States' largest conference focused on automatic test systems for U.S. military systems, and has been held annually since 1965. The conference is hold in Baltimore, Maryland this fall, all themes focused precisely on the current issues facing military automated test.  Amongst a variety of products, these latest models deserve attention and will be presented by the leading Boundary-scan provider:

> 相关阅读:
> 评论留言:
联系地址:北京丰台区广安路9号国投财富广场4号楼3A19
企业邮箱:tiger.lin@fbe-china.com
©2019 版权所有©北京中福必易网络科技有限公司 
热线电话:+(86)010 63308519